Xiris Introduces Flexible Thin Film Inspection at Intersolar North America 2010, San Francisco, CA
Xiris Automation Inc., a 20 year veteran in the machine vision industry, has developed TFI-FLEX, an inspection system used for detecting defects in Flexible Thin Film Photovoltaic Cells.
Designed for in-line quality control use by manufacturers of Flexible Thin Film Cells, TFI-FLEX is capable of detecting defects in surface quality and chemical deposition of cells at multiple points along a production line.
The TFI-FLEX Inspection System performs visual checks on the activated side of a flexible thin film cell, looking for defects that are specific to quality issues arising from the handling and manufacture of thin film cells, including topological defects such as scratches, bumps and dents; and print/deposition defects such as chemical deposition flaws, stains, spots, watermarks, fingerprints, and color variations.
The system uses a proprietary method of acquiring images with very low optical distortion in color and/or monochrome mode, detecting defects that are much smaller than 1 mm in size. TFI-FLEX is an important new tool for inspecting cells after deposition, after laser etching, after printing, and after final environmental coating of the cells. The system can easily be retrofitted into existing lines and can be configured to include multiple inspection modules (each with a solution-optimized design).
Xiris Automation Inc. specializes in developing high-end machine vision systems used for Quality Control inspection applications in the Optical Media, Tube and Pipe and Photovoltaic industries. Operating globally, our major focus in the Photovoltaics industry is in providing a number of machine vision products, including product inspection and classification for both thin film and crystalline silicon cell manufacturing.
Xiris Automation Inc. will be exhibiting at Intersolar North America 2010 in San Francisco's Moscone Center West Hall from July 13-15, booth number 8151.
Source: Xiris Automation Inc.